Citation: | FENG Wei, XU Shi-nan, WANG Heng-hui, XIONG Zhi, WANG Xuan-ze, ZHAI Zhong-sheng. Three-dimensional measurement method of highly reflective surface based on per-pixel modulation[J]. Chinese Optics, 2022, 15(3): 488-497. doi: 10.37188/CO.2021-0220 |
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