Volume 5 Issue 3
Jun.  2012
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BU Shao-fang, NI Qi-liang, HE Ling-ping, ZHANG Hong-ji, LIU Shi-jie. Microchannel plate photon counting detector in UV range[J]. Chinese Optics, 2012, 5(3): 302-309. doi: 10.3788/CO.20120503.0302
Citation: BU Shao-fang, NI Qi-liang, HE Ling-ping, ZHANG Hong-ji, LIU Shi-jie. Microchannel plate photon counting detector in UV range[J]. Chinese Optics, 2012, 5(3): 302-309. doi: 10.3788/CO.20120503.0302

Microchannel plate photon counting detector in UV range

  • Received Date: 11 Jan 2012
  • Rev Recd Date: 19 Mar 2012
  • Publish Date: 10 Jun 2012
  • A Microchannel Plate(MCP) photon detector was developed to detect the 30.4 nm radiation in a plasma layer of the earth. By changing voltages, temperatures and other parameters, the variations of the dark noise and resolution for the MCP detector were compared. The results indicate that the dark noise of the detector comes from the ion feedback of residual gas and the thermal noises mainly. Therefore, to reduce the dark noise, the microchannel should be preprocessed by removing residual gases and the detector could not work at a high temperature state. After preprocessing at the room temperature, the dark noise counting rate of the detector has reduced to 0.34 count/s穋m2. Furthermore, the temperature has a little effect on the resolution of the detector, and the resolution dependents on the variances of voltage or counting rate obviously. With different resist pressure abilities for different MCPs, it demonstrates that the proper voltage or counting rate can provide a better resolution.

     

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