Volume 4 Issue 2
Apr.  2011
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ZHANG Jing-he, ZHANG Shun-guo, DONG Yue-hua. Information reading of Ubbelohde interferometry[J]. Chinese Optics, 2011, 4(2): 147-153.
Citation: ZHANG Jing-he, ZHANG Shun-guo, DONG Yue-hua. Information reading of Ubbelohde interferometry[J]. Chinese Optics, 2011, 4(2): 147-153.

Information reading of Ubbelohde interferometry

  • Received Date: 02 Sep 2010
  • Rev Recd Date: 23 Nov 2010
  • Publish Date: 25 Apr 2011
  • For the shortcomings of the interference fringe difficult to read and adjust in an Ubbelohde interferometer, a He-Ne laser was used in the Ubbelohde interferometer as the source to offer interference fringe signals with high quality. Then, the fringe signals were transform into electron signals to implement the micro-displacement measurement precisely. A detection circuit was designed and the square wave signal was extracted by using a dual-threshold shaping circuit, which solveed the error processing problem when signals jittered near the set comparison value. A discerning direction and subdividing circuit was designed and the orthogonal electron signals were extracted to achieve the discerning direction of interference fringe movement and the subdivision of interference signals. On the schemes above, a laser interference detection device was designed and built. The device was calibrated by two standard gauge blocks with a difference value of 5 m. Under four subdividing circuits, the resolution of the detecting device is 79 nm. Therefore, the Ubbelohde interferometer achieveds automatic reading and improves its measurement precision.

     

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  • [1] 苏绍璟. 大量程纳米级光栅位移测量理论及关键技术研究 . 长沙:国防科技大学 ,2001. SU SH J. The theory and key technology of the large range of nano-grating displacement measurement . Changsha:National University of Defense Technology,2001.(in Chinese) [2] TOLLES W M. Nanoscience and nanotechnology in Europe[J]. Nanotechnology,1996,(7):59-105. [3] 高宏堂. 2.5维大范围纳米激光干涉测长信号处理子系统的研究 . 北京:中国计量科学研究院 ,2005. GAO H T. The study of 2.5-dimensional large-scale laser interferometer measuring signal processing subsystem . Beijing:National Institute of Metrology P.R.China.,2005.(in Chinese) [4] 宋浩. 高精度大量程位移测量与校准器的研究 . 武汉:华中科技大学 ,2007. SONG H. The study of large range and high-precision displacement measurement and calibration devices . Wuhan:Huazhong University of Science and Technology,2007.(in Chinese) [5] SUN CH S,YU L CH,SUN Y X,et al.. Scanning white-light interferometer for measurement of the thickness of a transparent oil film on water[J]. Appl. Opt.,2005,44:5202-5205. [6] 夏豪杰. 高精度二维平面光栅测量系统及关键技术研究 . 合肥:合肥工业大学 ,2006. XIA H J. High-precision of two-dimensional grating measurement system and key technologies . Hefei:Hefei University of Technology,2006.(in Chinese) [7] 郧建平. 基于白光干涉的表面形貌接触和非接触两用测量系统的研究 . 武汉:华中科技大学 ,2008. YUN J P. The study based on white light interference surface morphology of dual-use contact and non-contact measurement system . Wuhan:Huazhong University of Science and Technology,2008.(in Chinese) [8] 李东光,张国雄. 高速精密激光干涉测量的研究现状及其关键技术[J]. 航空精密制造技术 ,1998,34(6):29-34. LI D G,ZHANG G X. High speed precision laser interferometry's research and its key technologies[J]. Aviation Precision Manufacturing Technol.,1998,34(6):29-34.(in Chinese) [9] 李家猛. 嵌入式光纤温度传感器的设计 . 合肥:合肥工业大学 ,2007. LI J M. The design of embedded fiber-optic temperature sensor . Hefei:Hefei University of Technology,2007.(in Chinese) [10] 张丽平. 光栅测量在汽车轮毂跳动量测量中的应用 . 长春:长春理工大学 ,2008. ZHANG L P. The application of grating measured in the beating wheel measurement . Changchun:Changchun University of Science and Technology,2008.(in Chinese) [11] 陈莉. 球面曲率半径的单频激光干涉测量研究 . 南京:南京理工大学 ,2005. CHEN L. The study of single-frequency laser interferometer measure in spherical radius of curvature . Nanjing:Nanjing University of Science and Technology,2005.(in Chinese) [12] 韩旭东,艾华. 共光路移相单频激光干涉测长系统[J]. 光学技术 ,2004,30(2):195-198. HAN D X,AI H. Common-path phase single-rate laser interferometric system[J]. Opt. Technique,2004,30(2):195-198.(in Chinese) [13] 张景和.V形法测量中支撑对测量精度的影响[J]. 光学 精密工程 ,1998(5):128-132. ZHANG J H. Support for the measurement accuracy influence in V measurement[J]. Opt. Precision Eng.,1998(5):128-132.(in Chinese) [14] 刘岩,龙科慧,王立朋,等. 栅尺动态测量仪[J]. 光学 精密工程 ,1993,1(2):14-19. LIU Y,LONG K H,WANG L P,et al.. Grating dynamic measuring instrument[J]. Opt. Precision Eng.,1993,1(2):14-19.(in Chinese) [15] BINNIG G,QUATE C F,GEBRER C. Atomic force microscope[J]. Phys. Rev. Lett.,1986,56(9):930-933.
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