A novel high-precision refractive index measurement scheme based on entangled coherent states and parity detection
doi: 10.37188/CO.EN-2026-0002
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摘要:
传统基于强度探测的折射率测量方法受经典衍射极限与散粒噪声极限的制约，限制了测量精度的进一步提升。本文提出一种纠缠相干态结合奇偶探测方法的折射率测量新方案。该方案利用量子纠缠的非经典关联特性，构建双模纠缠相干态光源，通过奇偶探测手段实现信号的高性能测量。理论推导与数值仿真结果表明，所提方案的测量分辨率突破瑞利极限，在全损耗区域内相较于传统相干态测量方法，分辨率提升
$ \sqrt{N} $ 倍，在无损耗及损耗率低于 10% 的场景下，灵敏度超越散粒噪声极限。最后，对实验所面临的挑战进行了详细说明。该量子测量架构为精密光学检测、生物传感等领域提供了新的技术路径，具有显著的实用价值与广阔的应用前景。Abstract:Traditional intensity-based refractive index measurement methods are constrained by the classical diffraction limit and the shot noise limit, which severely restricts the improvement of measurement precision. To address this issue, a novel quantum measurement scheme integrating entangled coherent states (ECS) and parity detection (PD) is proposed. Taking advantage of the non-classical correlation of quantum entanglement, the scheme constructs a dual-mode entangled coherent state light source and realizes high-fidelity signal demodulation through a customized parity detection system. Theoretical derivation and numerical simulation results demonstrate that the measurement resolution of the proposed scheme breaks through the Rayleigh limit, achieving a
$ \sqrt{N} $ -fold improvement compared with the traditional coherent state measurement method in the full loss range. In lossless scenarios and cases with loss rates below 10%, the sensitivity surpasses the shot noise limit. Finally, the experimental challenges faced by the experiment are also elaborated in detail. This quantum measurement architecture provides a new technical pathway for precision optical detection, biosensing, and other fields, exhibiting significant practical value and broad application prospects. -
图 1 折射率测量系统结构示意图
Figure 1. Schematic representation of the refractive index measurement system.
图 2 ECS-PD，CS-PD和归一化ECS-ID方案折射率测量系统信号曲线
Figure 2. Signals of the refractive index measurement system for ECS-PD, CS-PD, and normalized ECS-ID schemes.
图 3 分辨率比值与光子数N的关系曲线
Figure 3. Relationship between the ratio of resolutions and the photon number N.
图 4 ECS-PD，CS-PD和ECS-ID方案的灵敏度曲线
Figure 4. Sensitivity curves of ECS-PD, ECS-ID and CS-PD schemes.
图 5 光子数对分辨率和灵敏度的影响示意图
Figure 5. Graph illustrating the impact of photon number on resolution and sensitivity.
图 6 ECS-PD，CS-PD和ECS-ID方案在不同波长时的FWHM与T的关系曲线
Figure 6. Relationships between FWHM and T for ECS-PD, CS-PD, and ECS-ID schemes used different wavelengths.
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