Turn off MathJax
Article Contents
GU Pei-bing, FU Xiu-hua, DONG Suo-tao, LI Zhi, ZHANG Jia-ming, XIE Hai-feng, WANG Shi-wu. Research on optical path optimization design and signal enhancement technology for direct optical film thickness control systems[J]. Chinese Optics. doi: 10.3724/CO.2025-0153
Citation: GU Pei-bing, FU Xiu-hua, DONG Suo-tao, LI Zhi, ZHANG Jia-ming, XIE Hai-feng, WANG Shi-wu. Research on optical path optimization design and signal enhancement technology for direct optical film thickness control systems[J]. Chinese Optics. doi: 10.3724/CO.2025-0153

Research on optical path optimization design and signal enhancement technology for direct optical film thickness control systems

cstr: 32171.14.CO.2025-0153
Funds:  Supported by introducing innovative new team projects in Zhongshan City (No. CXTD2023008); Zhongshan Social Public Welfare Science and Technology Research Project (No. 2024B2044)
More Information
  • Corresponding author: goptics@126.com
  • Received Date: 05 Dec 2025
  • Rev Recd Date: 17 Feb 2026
  • Accepted Date: 06 Feb 2026
  • Available Online: 29 Apr 2026
  • Film thickness is a critical parameter that determines optical performance, and the accuracy of its monitoring system directly affects spectral characteristics. To mitigate the significant thickness control errors in conventional direct monitoring systems—caused by light source divergence and weak detector response signals—this paper proposes an externalized optical configuration. In this design, both the optical transmitter and receiver are placed outside the vacuum chamber, thereby avoiding interference from chamber’s vibration, temperature variations, and assembly inconsistencies. Additionally, an optical signal modulation scheme based on fiber coupling and collimation-focusing is introduced. By adopting an external integrated light source combined with multimode optical fibers and a composite optical path, and by optimizing component parameters through optical simulation to improve spot quality and energy density, the stability of both optical and electrical signals is enhanced. After optimization, irradiance at the fiber receiving end increased by 222.7%, signal strength by 156.6%, and the signal-to-noise ratio by 70.38%. The system’s performance was validated by preparing a narrowband filter film with a center wavelength of 2400 nm and a bandwidth of 40 nm, achieving a wavelength deviation within 1 nm over three repeated tests while consistently maintaining the 40 nm bandwidth. These results confirm that the system enables high-precision and stable film thickness monitoring even in spectral bands with weak detector response.

     

  • loading
  • [1]
    唐晋发, 顾培夫, 刘旭. 现代光学薄膜技术[M]. 杭州: 浙江大学出版社, 2006.

    TANG J F, GU P F, LIU X. Modern Optical Thin Film Technology[M]. Hangzhou: Zhejiang University Press, 2006. (in Chinese).
    [2]
    庄秋慧, 王三强. 光学膜厚的监控方法[J]. 激光与光电子学进展, 2018, 55(10): 103102. doi: 10.3788/LOP55.103102

    ZHUANG Q H, WANG S Q. Monitoring method of optical film thickness[J]. Laser & Optoelectronics Progress, 2018, 55(10): 103102. (in Chinese). doi: 10.3788/LOP55.103102
    [3]
    常敏, 华博, 张学典, 等. 光电极值法结合外差干涉法监控膜厚的研究[J]. 光学技术, 2017, 43(2): 184-186. doi: 10.13741/j.cnki.11-1879/o4.2017.02.020

    CHANG M, HUA B, ZHANG X D, et al. Study on film monitoring based on the photoelectric extreme value method combined with heterodyne interferometry[J]. Optical Technique, 2017, 43(2): 184-186. (in Chinese). doi: 10.13741/j.cnki.11-1879/o4.2017.02.020
    [4]
    LI N, WANG G H, BAI X S, et al. Effect of quartz crystal thermal stress on its performance in active temperature control quartz crystal microbalance dew point sensors[J]. Sensors and Actuators B: Chemical, 2022, 369(10): 132283. doi: 10.1016/j.snb.2022.132283
    [5]
    DONG S T, FU X H, LI CH. Noble infrared optical thickness monitoring system based on the algorithm of phase-locked output current–reflectivity coefficient[J]. Coatings, 2022, 12(6): 782. doi: 10.3390/coatings12060782
    [6]
    杜昕, 付秀华, 董所涛, 等. 变量耦合动态监控光学膜厚补偿技术[J]. 中国光学(中英文), 2025, 18(3): 467-476.

    DU X, FU X H, DONG S T, et al. Variable coupling dynamic monitoring and compensation technology of optical film thickness[J]. Chinese Optics, 2025, 18(3): 467-476. (in Chinese).
    [7]
    MELZIG T, AMOCHKINA T, BRUNS S, et al. Influence of fitting algorithms on thickness determination during monitoring of optical coatings[J]. Surface and Coatings Technology, 2024, 476: 130197. doi: 10.1016/j.surfcoat.2023.130197
    [8]
    BRUNS S, FARR P, MELZIG T, et al. Improving optical thickness monitoring by including systematic and process-influenced transmittance deviations[J]. Applied Optics, 2023, 62(7): B141-B147.
    [9]
    TIKHONRAVOV A, KOCHIKOV I, SHARAPOVA S, et al. Optical monitoring of coating production: correlation of errors and errors self-compensation[J]. Proceedings of SPIE, 2021, 11872: 118720Q.
    [10]
    杨琪, 曾敏, 周文祺, 等. 基于直流磁控溅射VO2薄膜的高效近红外光电探测器[J]. 发光学报, 2025, 46(11): 2119-2128. doi: 10.37188/CJL.20250148

    YANG Q, ZENG M, ZHOU W Q, et al. DC magnetron-sputtered VO2 thin films: towards high-performance near-infrared photodetectors[J]. Chinese Journal of Luminescence, 2025, 46(11): 2119-2128. (in Chinese). doi: 10.37188/CJL.20250148
    [11]
    张丹丹, 黄芷婷, 李君, 等. 半导体激光器与光纤耦合效率仿真分析[J/OL]. 应用光学, 2025: 1-15 (2025-09-01)[2025-11-24]. https://link.cnki.net/urlid/61.1171.O4.20250901.1415.002.

    ZHANG D D, HUANG ZH T, LI J, et al. Optimization of coupling efficiency between semiconductor laser and fiber based on intelligent algorithm[J/OL]. Journal of Applied Optics, 2025: 1-15 (2025-09-01)[2025-11-24]. https://link.cnki.net/urlid/61.1171.O4.20250901.1415.002. (in Chinese).
    [12]
    王锦荣, 叶建春, 侯丽英, 等. 基于Zemax非球面单透镜的优化设计[J]. 空间电子技术, 2024, 21(5): 87-92. doi: 10.3969/j.issn.1674-7135.2024.05.013

    WANG J R, YE J CH, HOU L Y, et al. The optimum design of aspherical single lens based on Zemax[J]. Space Electronic Technology, 2024, 21(5): 87-92. (in Chinese). doi: 10.3969/j.issn.1674-7135.2024.05.013
    [13]
    周双, 刘子建. 光学系统装配误差分析及装调路径优选[J]. 机械设计与制造, 2022, 371(1): 159-163,167. doi: 10.3969/j.issn.1001-3997.2022.01.036

    ZHOU SH, LIU Z J. The assembly error analysis of optical system and path optimization of alignment[J]. Machinery Design & Manufacture, 2022, 371(1): 159-163,167. (in Chinese). doi: 10.3969/j.issn.1001-3997.2022.01.036
    [14]
    Prosovskii O Y, Denisov G D, Prosovskii F O, et al. Direct monochromatic optic control system of the thickness of thin-film interference coatings applied in vacuum[C]//Bauman Moscow State Technical Univ. (Russian Federation); Technologiya (Russian Federation), 2019:
    [15]
    Inc. IV. Thickness uniformity control for epitaxially-grown structures ina chemical vapor deposition system: US201715818371[P]. 2018-05-24.
    [16]
    LTD C O. Apparatus and method for thin film formation and optical film thickness monitoring device: JP20130002904[P]. 2014-07-24.
    [17]
    谢海峰, 付秀华, 董所涛, 等. 膜厚监控系统准直聚焦耦合光路的研制[J]. 光学 精密工程, 2025, 33(1): 25-36.

    XIE H F, FU X H, DONG S T, et al. Development of collimated focus coupled optical path for film thickness monitoring system[J]. Optics and Precision Engineering, 2025, 33(1): 25-36. (in Chinese).
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Figures(18)  / Tables(7)

    Article views(273) PDF downloads(5) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return