[1] FEIT M D,RUBENCHIK A M,KOZLOWSKI M R,et al.. Extrapolation of damage test data to predict performance of large-area NIF optics at 355 nm[J]. SPIE,1998,3578:226-234.
[2] HUE J,GENIN F Y,MARICLE S M,et al.. Towards predicting the laser damage threshold of large-area optics[J]. SPIE,1997,2966:451-462.
[3] COMBIS P,BONNEAU F,et al. Laser-induced damage simulations of absorbing materials under pulsed IR irradiation[J]. SPIE,2000,3902:317-323.
[4] ZAITSU SH-I,MOTOKOSHI SH J,JITSUNO T K,et al.. Laser-induced damage of optical coatings grown with surface chemical reaction[J]. SPIE,1999,3492:204-211.
[5] RUNKEL M J,WILLIAMS W H,De YOREO J J. Predicting bulk damage in NIF triple harmonic generators[J]. SPIE,1999,3578:322-335.
[6] 刘雄英,黄光周,范艺. 原子层沉积技术及应用发展概况[J]. 真空科学与技术学报 ,2006(增):146-153,158. LIU X Y,HUANG G ZH,FAN Y. Development in atomic layer deposition and its applications[J]. Chinese J. Vacuum Sci. and Technol.,2006(s):146-153,158.(in Chinese)
[7] SNEH O,CLARK-PHELPS R B,LONDERGAN A R,et al.. Thin film atomic layer deposition equipment for semiconductor processing[J]. Thin Solid Films,2002,402(1-2):248-261.
[8] TRIANI G,EVANS P J,MITCHELL D R G,et al. Atomic layer deposition of TiO2/Al2O3 films for optical applications[J]. SPIE,2005,5870:587009.
[9] CARCIA P F,MCLEAN R S,REILLY M H,et al.. Ca test of Al2O3 gas diffusion barriers grown by atomic layer deposition on polymers[J]. Appl. Phys. Lett.,2006,89(3):031915.
[10] RITALA M,LESKEL M. Atomic layer epitaxy-a valuable tool for nanotechnology[J]. Nanotechnology,1999,10(1):19-24.
[11] MATERO R,RAHTU A,RITALA M,et al.. Effect of water dose on the atomic layer deposition rate of oxide thin films[J]. Thin Solid Films,2000,368(1):1-7.
[12] AARIK J,AIDLA A,M MDAR H,et al.. Atomic layer deposition of titanium dioxide from TiCl4 and H2O:investigation of growth mechanism[J]. Appl. Surf. Sci.,2001,172(1-2):148-152.
[13] RITALA M,LESKEL M,DEKKER J-P,et al.. Perfectly conformal TiN and Al2O3 films deposited by atomic layer deposition[J]. Chem. Vapor Deposition,1999,5(1):7-9.
[14] ZAITSU SH-I,MOTOKOSHI SH J,JITSUNO T K. Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition[J]. Jpn. J .Appl Phys,2004,43(3):1034-1035.
[15] RITALA M,LESKELA M. Handbook of Thin Film Materials[M]. San Diego:HS Nalwa Academic,2001.
[16] 胡建平,唐明,张问辉,等. 355 nm紫外激光损伤阈值自动测量装置及实验[J]. 光学与光电技术 ,2005,3(3):22-25. HU J P,TANG M,ZHANG W H,et al.. Automatic measurement device of damage threshold of 355 nm laser and its experiment[J]. Opt. and Optoelectronic Technol.,2005,3(3):22-25.(in Chinese)
[17] ZAITSU SH-I,MOTOKOSHI SH J,JITSUNO T K,et al. Large-area optical coatings with uniform thickness grown by surface chemical reactions for high power laser applications[J]. Jpn. J. Appl. Phys.,2002,41:160-165.
[18] ZAITSU SH-I,JITSUNO T K,NAKATSUKA M S,et al.. Optical thin films consisting of nanoscale laminated layers[J]. Appl. Phys. Lett.,2002,80(14):2442-2444.
|