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摘要:
为了探索二氧化钛（TiO2）/聚对苯乙烯磺酸钠（PSS）纳米薄膜对Kretschmann型表面等离子体共振传感器的影响，系统地研究了沉积不同厚度TiO2/ PSS纳米薄膜后传感器的光谱变化，并通过理论模拟分析了光谱变化的内在原因。首先，采用静电层层自组装技术在溅射了金膜的玻璃芯片表面原位沉积了不同层数的TiO2/PSS薄膜，并实时记录了相应的反射光谱。然后，对原始反射光谱数据进行处理，使光谱曲线更加清晰可见。最后，用MATLAB软件编程对实验结果进行了模拟分析。结果显示，在450~900 nm的波长范围内，随着TiO2/PSS层数的增加，传感器光谱中先后出现了4种不同类型的反射峰，这4类反射峰分别对应了传感器的表面等离子体共振模式、横磁模的一阶模式、二阶模式和三阶模式。研究结果表明通过控制TiO2/PSS薄膜的厚度能调制Kretschmann型传感器的感应模式和反射光谱类型。
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关键词:
- Kretschmann /
- 传感器 /
- 层层自组装 /
- 传感模式
Abstract:In order to explore the effect of titanium dioxide (TiO2)/poly(sodium 4-styrenesulfonate) (PSS) nanofilms on the Kretschmann-type surface plasmon resonance sensor, the spectral changes of the sensor after depositing TiO2/PSS nanofilms of different thicknesses were systematically studied. The reasons for the spectral changes were further explained and discussed theoretically. First, TiO2/PSS multilayer films were deposited in situ on the surface of the glass chip sputtered with a gold layer via electrostatic layer-by-layer self-assembly technology, and the corresponding reflection spectra of the sensor were recorded in real time. Then, the original reflectance spectrum data was processed to make the spectral curve clearer and more visible. Finally, the experimental results were simulated and analyzed using MATLAB software programming. The results show that with the number of TiO2/PSS bilayers increasing, four different types of reflection peaks successively appeared in the sensor’s spectra in the 450−900 nm wavelength range. The four types of reflection peaks correspond to the surface plasmon resonance mode, the first-order mode, the second-order mode, and the third-order mode of the transverse magnetic mode of the sensor, respectively. This indicates that the Kretschmann-type sensor’s sensing mode and reflection spectrum type can be modulated by controlling the thickness of TiO2/PSS thin films.
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Key words:
- Kretschmann /
- sensor /
- layer-by-layer self-assembly /
- sensing mode
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图 1 Kretschmann型表面等离子共振传感器测量原理图
Figure 1. Schematic diagram of the Kretschmann-type surface plasmon resonance sensor’s measurement principle
图 2 Kretschmann型传感器测试方案框架图
Figure 2. Framework diagram of the testing scheme for the Kretschmann-type sensor
图 3 TiO2/PSS多层膜在空气中的UV-Vis吸收光谱。内插图是250 nm波长下吸收强度与双层数之间的函数关系
Figure 3. UV-Vis absorption spectra of TiO2/PSS multilayer films in air. The inset picture is the absorbance intensity at 250 nm v.s. the number of bilayers
图 4 组装不同双层TiO2/PSS膜的传感器的反射光谱：在水中的结果，（a）n为1~5，（c）n为9~19，（e）n为21~36；在空气中的结果，（b）n为1~5，（d）n为12~25，（f）n为28~48
Figure 4. Reflected light intensity spectra of sensors with different bilayers of TiO2/PSS films: in water (a) n = 1−5, (c) n = 9−19, (e) n = 21−36; in air (b) n = 1−5, (d) n = 12−25, (f) n = 28−48
图 5 组装不同双层TiO2/PSS薄膜的传感器在水和空气中的吸收光谱。（a）n = 1~5，（b）n = 9~19，（c）n = 20~34，（d）n = 35~48
Figure 5. Absorption spectra of sensors assembled with different bilayer TiO2/PSS films in both water and air. (a) n = 1−5, (b) n = 9−19 , (c) n = 20−34, (d) n = 35−48
图 6 组装 TiO2/PSS薄膜的传感器反射光谱中的反射峰波长与TiO2/PSS薄膜层数之间的关系。（a）在水中的结果，a代表n=0~1，b代表n=9~19，c代表n=20~34，d代表n=35~48；（b）在空气中的结果e代表n=1~5，f代表n=11~19，g代表n=25~34，h代表n=38~48
Figure 6. The relationship between the resonance wavelength in the reflectance spectrum and the number of TiO2/PSS film bilayers. (a) In water a: n = 0−1, b: n = 9−19, c: n = 20−34, d: n = 35−48; b: in air e: n = 1−5, f: n = 11−19, g: n = 25−34, h: n = 38−48
图 7 TiO2/PSS薄膜厚度与Kretschmann型传感器的横向磁场模式分布之间的关系。（a）在水中，薄膜厚度为100 nm；（b）在水中，薄膜厚度为300 nm；（c）在空气中，薄膜厚度为400 nm；（d）在水中，薄膜厚度为600 nm；（e）在水中，薄膜厚度为
1000 nmFigure 7. The relationship between the film thickness and transverse magnetic field mode distribution. (a) 100-nm thick film in water, (b) 300-nm thick film in water, (c) 400-nm thick film in air, (d) 600-nm thick film in water, (e)
1000 -nm thick film in water -
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