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高分辨率表面等离子体显微镜综述

蔡浩原

蔡浩原. 高分辨率表面等离子体显微镜综述[J]. 中国光学(中英文), 2014, 7(5): 691-700. doi: 10.3788/CO.20140705.0691
引用本文: 蔡浩原. 高分辨率表面等离子体显微镜综述[J]. 中国光学(中英文), 2014, 7(5): 691-700. doi: 10.3788/CO.20140705.0691
CAI Hao-yuan. Review of high resolution surface plasmon microscopy[J]. Chinese Optics, 2014, 7(5): 691-700. doi: 10.3788/CO.20140705.0691
Citation: CAI Hao-yuan. Review of high resolution surface plasmon microscopy[J]. Chinese Optics, 2014, 7(5): 691-700. doi: 10.3788/CO.20140705.0691

高分辨率表面等离子体显微镜综述

doi: 10.3788/CO.20140705.0691
基金项目: 

国家自然科学基金资助项目(No.61372052)

详细信息
    作者简介:

    蔡浩原(1977- )男,广西桂平人,博士,副研究员,1998年于清华大学获得学士学位,2003年于中国科学院电子学研究所获得博士学位,主要从事微纳传感器及分析仪器方面的研究。

  • 中图分类号: TP394.1;TH691.9

Review of high resolution surface plasmon microscopy

  • 摘要: 本文对表面等离子体显微镜的原理、架构和应用进行了综述,指出表面等离子体显微镜技术的未来发展方向是着力提高横向分辨率,接近光学衍射极限,以及发展与电化学、力学等微纳操纵手段结合的表面等离子体显微镜,形成微纳尺度下显微成像和操纵的闭环测量路径。

     

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出版历程
  • 收稿日期:  2014-05-11
  • 修回日期:  2014-07-13
  • 刊出日期:  2014-09-25

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