单色器晶体角度微振动的高精度原位检测技术

樊奕辰; 李中亮; 徐中民; 张琦; 刘运; 王劼

doi:10.3788/CO.20201301.0156

单色器晶体角度微振动的高精度原位检测技术

doi: 10.3788/CO.20201301.0156

樊奕辰^{1, 2, 4,},
李中亮^{1, 2},
徐中民^{1, 2},
张琦³,
刘运^{1, 2},
王劼^{1, 2, ,}

1.
中国科学院上海应用物理研究所, 上海 201204
2.
中国科学院上海高等研究院, 上海 201204
3.
东南大学, 江苏南京, 211189
4.
中国科学院大学, 北京 100049

基金项目:

国家自然科学基金项目 No.11505279

详细信息

作者简介:
樊奕辰(1988-), 女, 江苏连云港人, 博士研究生, 助理研究员, 2013年于中国科学院大学获得硕士学位, 主要从事同步辐射光学与技术的研究。E-mail:fanyichen@sinap.ac.cn

王劼(1963—)，男，安徽合肥人, 博士，研究员, 博士生导师, 1995年于中国科学院上海光学精密机械研究所获得博士学位, 主要从事同步辐射应用和光束线技术。E-mail:wangjie@sinap.ac.cn

中图分类号: O434.1
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- 被引次数: 0
出版历程
- 收稿日期: 2019-04-22
- 修回日期: 2019-06-04
- 刊出日期: 2020-02-01

High-accuracy in-situ detection method of monochromator angular vibration

FAN Yi-chen^{1, 2, 4
,},
LI Zhong-liang^{1, 2},
XU Zhong-min^{1, 2},
ZHANG Qi³,
LIU Yun^{1, 2},
WANG Jie^{1, 2
, ,}

1.
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China
2.
Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
3.
Dongnan University, Nanjing 211189, China
4.
University of Chinese Academy of Sciences, Beijing 100049, China

Funds:

Supported by National Natural Science Foundation of China No.11505279

More Information

Corresponding author: WANG Jie, E-mail:wangjie@sinap.ac.cn

摘要

摘要: 为实现对双晶单色器角度微振动的原位测量，设计了基于双频激光干涉仪的双晶单色器晶体角度微振动测试系统，并搭建了实验平台。激光经干涉计偏振分光后射向被测晶面，对反射信号调制解调求得晶面两端的位移偏差，从而高频获取晶面的角度位移信息。通过数据预处理可以有效去除夹杂在数据中的噪声及直流分量，应用快速傅立叶变换处理得到晶体角度振动的频谱信息，准确获取对晶体稳定性产生影响的特征频率，从而分析影响晶体稳定性的主要振源。该方案可实现晶体角位移的高频采集，分辨率高达25 nrad，并能准确分析出不同振源影响下晶体微振动的情况，为单色器结构优化提供参考。
- 同步辐射 /
- 双晶单色器 /
- 角度微振动 /
- 双频激光干涉仪
Abstract: In order to achieve in-situ measurement of Double-Crystal Monochromator(DCM) stability, an angular vibration measuring system based on dual-frequency interferometers is designed, and a measurement platform is also established. A laser is split into two beams with an interferometer and then is aimed at the crystal surface. Reflective signals from both ends of the crystal are demodulated by a data acquisition board and the crystals' angular displacement information is acquired at high frequency. Its frequency information can also be obtained by means of Fast Fourier Transform(FFT), from which the primary source of vibration that influences the stability of the monochromator can be deduced. We can achieve high-frequency acquisition of crystal angular displacement with a resolution of up to 25nrad.With this, information on the different sources of vibration can be distinguished, which can be significant in DCM structure optimization.
- synchrotron radiation /
- double-crystal monochromator /
- angular vibration /
- dual-frequency interferometer

HTML全文

图 1 晶体微振动示意图

Figure 1. Schematic of DCM micro vibration

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图 2 双频激光干涉仪双晶角度稳定性测试原理图

Figure 2. Schematic diagram of angular vibration measuring principle of DCM by dual-frequency interferometer

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图 3 单色器角度稳定性测试实验图

Figure 3. DCM angular stability measurement

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图 4 不同工作状态下的晶体投角位移时域图(a)及其局部放大图(b)

Figure 4. (a) Time domain diagram of pitch angular displacement under different working conditions and (b) its local enlarged view

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图 5 投角振动频谱分析

Figure 5. Analysis of frequency spectrum for pitch angular vibration

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图 6 晶体投角振幅分析

Figure 6. Amplitude analysis of pitch vibration

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