Abstract: The radiation environment is one of the reasons for the invalidation of CCD remote sensing cameras. In order to improve reliability of the cameras, anti-radiation techniques for electronic devices in CCD cameras were researched. The space radiation enviroment was introduced, then it points out that the solar activity, cosmic ray, Van Allent Belt and the secondary radiation are main sources of the radiation damage. Based on the study of space radiation environment, the radiation damage especially caused by Total Ionizing Dose(TID), Single Event Effect(SEE) and Displacement Damage(DD) on the electronic devices and integrated circuits was analyzed, respectively. Focused on the CCD camera, the anti-radiation tactics were proposed for CCD devices, integrated circuits and FPGA aspects. In the end, validating experiments for anti-radiation TID and anti-radiation SEE were carried out. Results demonstrate that this research provides some methods to increase the anti-radiation ability and improve the reliability of CCD remote sensing cameras.