留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

表面损伤衍射双向反射分布函数模型建立及分析

陆敏 王治乐 张树青

陆敏, 王治乐, 张树青. 表面损伤衍射双向反射分布函数模型建立及分析[J]. 中国光学(中英文), 2021, 14(2): 375-381. doi: 10.37188/CO.2020-0162
引用本文: 陆敏, 王治乐, 张树青. 表面损伤衍射双向反射分布函数模型建立及分析[J]. 中国光学(中英文), 2021, 14(2): 375-381. doi: 10.37188/CO.2020-0162
LU Min, WANG Zhi-le, ZHANG Shu-qing. Establishment and analysis of the diffraction bidirectional reflection distribution function model for surface defects[J]. Chinese Optics, 2021, 14(2): 375-381. doi: 10.37188/CO.2020-0162
Citation: LU Min, WANG Zhi-le, ZHANG Shu-qing. Establishment and analysis of the diffraction bidirectional reflection distribution function model for surface defects[J]. Chinese Optics, 2021, 14(2): 375-381. doi: 10.37188/CO.2020-0162

表面损伤衍射双向反射分布函数模型建立及分析

基金项目: 中国航空研究院航空科学基金(No. 20160177007)
详细信息
    作者简介:

    陆 敏(1994—),女,吉林白山人,博士研究生,2015年于长春理工大学获得学士学位,主要从事光学检测方面的研究。E-mail:18243087454@163.com

    王治乐(1975—),男,河南偃师人,博士,教授,主要从事光学检测技术和光电系统半实物仿真技术方面的研究。E-mail:wangzhile@hit.edu.cn

  • 中图分类号: O436

Establishment and analysis of the diffraction bidirectional reflection distribution function model for surface defects

Funds: Supported by Aviation Science Foundation of China Aviation Research Institute (No. 20160177007)
More Information
  • 摘要: 建立了包括划痕和坑点在内的表面损伤的衍射双向反射分布函数(BRDF)模型,并分析了模型在各领域中的应用。通过使用非傍轴标量衍射理论,提出了采用相干窗口函数滤波的方法得到非相干光条件下的表面损伤衍射BRDF模型,得到了表面划痕和坑点的散射特性。该方法在表面损伤检测、表面损伤杂光分析以及图像渲染技术等领域都有重要的应用价值。

     

  • 图 1  非相干辐射原理

    Figure 1.  Incoherent illumination theory

    图 2  波长为(a) 0.3 μm,(b) 0.5 μm及(c) 0.8 μm的划痕仿真结果

    Figure 2.  Simulation results of scratches with a wavelength of (a) 0.3 μm, (b) 0.5 μm and (c) 0.8 μm

    图 3  不同级数表面损伤的TIS

    Figure 3.  TIS with different defect grade numbers

    图 4  粗糙材料表面(a)和光滑材料表面(b)划痕的BRDF影响

    Figure 4.  BRDF effect of a scratch on a rough material surface (a) and a smooth material surface (b)

  • [1] LU M, WANG ZH L, WANG H L, et al. Defects scattering imaging system of 20 inch PMTs’ glass shell suitable for digital image processing[J]. Proceedings of SPIE, 2018, 10847: 108470C.
    [2] 陆敏, 王治乐, 高萍萍, 等. 光学元件的疵病检测及现状[J]. 光学仪器,2020,42(3):88-94.

    LU M, WANG ZH L, GAO P P, et al. Defect detection and current situation of optical components[J]. Optical Instruments, 2020, 42(3): 88-94. (in Chinese)
    [3] 王拯洲, 段亚轩, 王力, 等. 基于邻域向量内积局部对比度图像增强的光学元件损伤检测[J]. 光学 精密工程,2019,27(12):2668-2682. doi: 10.3788/OPE.20192712.2668

    WANG ZH ZH, DUAN Y X, WANG L, et al. Detecting optical component damage based on neighborhood vector dot contrast image enhancement[J]. Optics and Precision Engineering, 2019, 27(12): 2668-2682. (in Chinese) doi: 10.3788/OPE.20192712.2668
    [4] GERMER T A. Angular dependence and polarization of out-of-plane optical scattering from particulate contamination, subsurface defects, and surface microroughness[J]. Applied Optics, 1997, 36(33): 8798-8805. doi: 10.1364/AO.36.008798
    [5] PETERSON G L. A BRDF model for scratches and digs[J]. Proceedings of SPIE, 2012, 8495: 84950G.
    [6] HARVEY J E, VERNOLD C L, KRYWONOS A, et al. Diffracted radiance: a fundamental quantity in nonparaxial scalar diffraction theory[J]. Applied Optics, 1999, 38(31): 6469-6481. doi: 10.1364/AO.38.006469
    [7] 夏志林, 曾翔, 刘世杰, 等. 基于波面面形的滤波计算[J]. 光学 精密工程,2016,24(12):3033-3040. doi: 10.3788/OPE.20162412.3033

    XIA ZH L, ZENG X, LIU SH J, et al. Filter calculation based on wavefront figures[J]. Optics and Precision Engineering, 2016, 24(12): 3033-3040. (in Chinese) doi: 10.3788/OPE.20162412.3033
    [8] WERNER S, VELINOV Z, JAKOB W, et al. Scratch iridescence: wave-optical rendering of diffractive surface structure[J]. ACM Transactions on Graphics, 2017, 36(6): 207.
    [9] RAYMOND B, GUENNEBAUD G, BARLA P. Multi-scale rendering of scratched materials using a structured SV-BRDF model[J]. ACM Transactions on Graphics, 2016, 35(4): 57.
    [10] WEIN S J. Small-angle scatter measurement[D]. Tucson: University of Arizona, 1989.
    [11] 黄聪, 张科鹏, 王翔, 等. 基于总散射测量的表面质量检测新方法[J]. 光学学报,2019,39(7):0712005. doi: 10.3788/AOS201939.0712005

    HUANG C, ZHANG K P, WANG X, et al. Method for surface quality inspection based on total scattering measurement[J]. Acta Optica Sinica, 2019, 39(7): 0712005. (in Chinese) doi: 10.3788/AOS201939.0712005
    [12] KRYWONOS A. Predicting surface scatter using a linear systems formulation of non-paraxial scalar diffraction[D]. Central Florida: University of Central Florida, 2006.
    [13] 高春甫, 邬敏. 粗糙表面精度测量系统的研究[J]. 光学 精密工程,2005,13(6):697-702.

    GAO CH P, WU M. Study of measurement system for rough surface accuracy[J]. Optics and Precision Engineering, 2005, 13(6): 697-702. (in Chinese)
    [14] 陆敏, 王治乐, 高萍萍, 等. 用于快速BRDF测量的子孔径扫描傅立叶变换系统[J]. 光学学报,2020,40(13):1329001. doi: 10.3788/AOS202040.1329001

    LU M, WANG ZH L, GAO P P, et al. A sub-aperture scanning Fourier transform system for fast BRDF measurements[J]. Acta Optica Sinica, 2020, 40(13): 1329001. (in Chinese) doi: 10.3788/AOS202040.1329001
  • 加载中
图(4)
计量
  • 文章访问数:  1546
  • HTML全文浏览量:  386
  • PDF下载量:  77
  • 被引次数: 0
出版历程
  • 收稿日期:  2020-09-07
  • 修回日期:  2020-09-23
  • 网络出版日期:  2021-02-08
  • 刊出日期:  2021-03-23

目录

    /

    返回文章
    返回